Dissertation Defense

Electrical Characterization of A1GaN/GaN MODFET: A reliability-driven low frequency noise-based study

Name: Electrical Characterization of A1GaN/GaN MODFET: A reliability-driven low frequency noise-based study
Start: 2005-04-12T13:30:00-04:00
End: 2005-04-12T13:30:00-04:00

Pouya Valizadeh

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Tuesday, April 12, 2005 @ 1:30 pm
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Dissertation Defense

Electrical Characterization of A1GaN/GaN MODFET: A reliability-driven low frequency noise-based study

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